Scanning electron microscopy and microprobe: electron optics, electron beam - specimen interaction, signal detection, image formation, contrast types. EDX and WDX spectroscopy; qualitative and quantitative x-ray analysis.
Transmission electron microscopy: elastic and inelastic scattering phenomena. The microscope: the illumination system, the objective lens and stage, the imaging system. Introduction to the different types of contrast. Introduction to electron diffraction. Sample preparation techniques.
Understanding the fundamentals of electron microscopies and energy dispersive x-ray spectroscopy, which permit the observation and characterization of heterogeneous organic and inorganic materials.
“Scanning Electron Microscopy and X-ray Microanalysis”, J.I. Goldstein, D.E. Newbury, P. Echlin, D.C. Joy, A.D. Romig, Jr., C.E. Lyman, C. Fiori, E. Lifshin, Plenum Press, 1992.
“Trasmission Electron Microscopy”, D.B. Williams and C.B. Carter, Plenum Press, 1996.